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Now Appearing in RMP: Recently Posted Review and Colloquia

   Reviews of Modern Physics

Optical excitations in electron microscopy

F.J. García de Abajo

Electron microscopes utilize the focusing of electron beams on subnanometer spots to probe metal and/or dielectric response either by analyzing electron energy loss or by detecting emitted radiation. This review discusses the interaction of energetic electrons with matter using classical and quantum formulations and then describes the underlying phenomenology giving rise to unmatched spatial and energy resolution of both localized and extended optical excitations, including plasmons.

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